The True Score Model
Every observed score $X$ is modeled as:
\[X = T + E\]where $T$ is the true score (expected value over hypothetical repeated testings) and $E$ is random error. Three fundamental assumptions follow: $\mathbb{E}[E] = 0$, errors are uncorrelated with true scores ($\rho_{TE} = 0$), and errors on parallel forms are uncorrelated.
The variance decomposition is then:
\[\sigma^2_X = \sigma^2_T + \sigma^2_E\]Reliability
Reliability $\rho_{XX’}$ is the ratio of true-score variance to observed-score variance:
\[\rho_{XX'} = \frac{\sigma^2_T}{\sigma^2_X} = 1 - \frac{\sigma^2_E}{\sigma^2_X}\]Cronbach’s $\alpha$ estimates internal-consistency reliability from a single administration of $k$ items:
\[\alpha = \frac{k}{k-1}\left(1 - \frac{\sum_{i=1}^k \sigma^2_i}{\sigma^2_X}\right)\]Values $\ge 0.70$ are conventionally acceptable for research purposes.
Standard Error of Measurement
The SEM quantifies the spread of observed scores around an individual’s true score:
\[\text{SEM} = \sigma_X\sqrt{1 - \rho_{XX'}}\]A 95% confidence interval for $T$ given $X$ is approximately $X \pm 1.96 \cdot \text{SEM}$. Note that SEM is constant across the score range—a key limitation compared to IRT, where measurement precision varies with ability level.